ANALYSE, CHAPITRE 6: APPLICATION DE L'INTÉGRALE DÉFINIE by Swokowski

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By Swokowski

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D. Brown, R. H. ), 1987, p. 2S7. [11] G. Wiech, in: Emission and Scattering Techniques. Ser. C (P. ), Nato Adv. , 1981, p. IOl [12] G. F. Bastin, H. J. M. Heijligers, Quantitative Electon-Probe Microanalysis of Nitrogen. Internal Report, Eindhoven, University of Technology, September 1988. [13] G. F. Bastin, H. 1. M. Heijligers, Quantitative Electon-Probe Microanalysis of Oxygen. Internal Report, Eindhoven, University of Technology, December 1989. [14] A. , 1990. [IS] V. D. Scott, G. Love, in: Electron Probe Quantitation (K.

T) II 400 AI overlayers Au substrate § 0 t) f .... g/cml 0 100 0 1000 teInD) 500 0 0 tOO 100 J:I ::I 0 lOCI Doptb. " , . / - Il. II 1l... 6. Al coatings on a gold substrate. Left: measured AI- Ka (X-ray) intensities from the overlayers; right: measured Au- La X-ray intensities from the substrate (both as a function of the coating thickness) Insert: (pz) function. The experimental points and solid lines are taken from [34]. The straight dotted lines have been added to underline the thickness range where the Ix = f(t)-relationship is linear.

Bastin, H. J. M. Heijligers in: Proc. 11th ICXOM Conference, London, Canada (1. D. Brown, R. H. ), 1987, p. 2S7. [11] G. Wiech, in: Emission and Scattering Techniques. Ser. C (P. ), Nato Adv. , 1981, p. IOl [12] G. F. Bastin, H. J. M. Heijligers, Quantitative Electon-Probe Microanalysis of Nitrogen. Internal Report, Eindhoven, University of Technology, September 1988. [13] G. F. Bastin, H. 1. M. Heijligers, Quantitative Electon-Probe Microanalysis of Oxygen. Internal Report, Eindhoven, University of Technology, December 1989.

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